By Dawn Kawamoto, 16 January 2006 08:20
NEWS
The US Department of Homeland Security announced on Friday that it's launching a second test of its electronic passport initiative next week, as it seeks to curtail the use of bogus passports at international airports.
Testing of the e-passports, which carry biometric identification technologies, will be conducted at San Francisco International Airport, as well as Changi Airport in Singapore and Sydney Airport in Australia. The testing began on Sunday and will continue until 15 April, with the help of the Australian, New Zealand and Singaporean governments.
Jim Williams, director of US-Visit, a Homeland Security programme, said in a statement: "This test provides an important opportunity to work with our international partners... to put in place an e-passport reader solution by the end of fall of this year."
The passports contain biometric information such as a digital photo, as well as biographic information. The technology being tested promises to read and verify the electronic data when those carrying the e-passports attempt entry into the countries via participating airports.
Australian and New Zealand citizens, Singapore Airlines officials and US diplomats are among those who have been issued with the e-passports. These people will also undergo normal screening procedures at the international airports.
The test will be used to gather information to help countries develop their respective electronic passport, according to the Department of Homeland Security. The e-passport must comply with the standards issued by the International Civil Aviation Organization.
Previously, the Department of Homeland Security conducted testing at Los Angeles International Airport and Sydney Airport, after which it determined further testing was needed.
Dawn Kawamoto writes for CNET News.com
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